This is a recording of the demonstration the use of the Nanosurf CoreAFM for Magnetic Force Microscopy (MFM). Dr. Denis Vasyukov, application scientist, conducts the demonstration during which he demonstrates how to obtain MFM data on a CoreAFM. The demo addresses operation in both single and dual pass modes. In single pass, the MFM signal is measured at a constant height and thus there is no topography information. In dual pass mode, each scanline is scanned twice, once to obtain topography and then to collect the MFM signal.