Choosing between scanning probe and scanning electron microscopies

Speaker: Dr. Dalia Yablon

This webinar will discuss three of the most popular high-resolution microscopy-based methods that provide nanoscale information: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning probe microscopy/atomic force microscopy (SPM/AFM). The differences in capabilities, practical considerations, and material information provided from each method will be presented.