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Unveiling the Power of Electrical Modes

Download our white paper and understand electrical AFM and its impact on different industries.

Explore the forefront of nanoscale electrical characterization with our white paper on electrical Atomic Force Microscopy. This guide offers a comprehensive overview of electical AFM techniques, including the conductivity analysis of Conductive AFM, the surface potential insights of Kelvin Probe Force Microscopy, the material properties investigations of Piezoresponse Force Microscopy, and the permittivity and dielectric measurements afforded by Scanning Microwave Microscopy.

What you'll discover:

  • The historical evolution of electrical AFM, charting its rise from a novel concept to a nanotech essential.
  • Examples of real-world applications of electrical modes, demonstrating their impact on material and device characterization.
  • The expansive influence of AFM techniques across a range of industries, from semiconductor manufacturing to energy storage solutions and the development of biomedical devices.
  • An explanation of how each AFM mode operates, detailing the specific interactions between the probe and the sample that allow for such detailed analysis.

This white paper is designed for those ready to delve into the capabilities of AFM technology and apply its insights to drive innovation in research and industry, offering a comprehensive guide to its multifaceted applications.

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