
Welcome to Nanosurf Insights — Your go-to hub for all things related to Atomic Force Microscopy
Here, we curate a wealth of resources designed to enrich your understanding and application of AFM. Our collection spans across the latest company news, insightful white papers, in-depth application notes, fascinating measurements, and updates on our cutting-edge products.
Dive into our most recent articles below, browse through our content by topic, or simply search to find the insights that matter to you most. Whether you're a seasoned professional or new to the world of AFM, our blog is here to support your journey of discovery and innovation. Explore, learn, and stay ahead with Nanosurf.
Recent Posts
- Héctor Corte-León
- November 10, 2023
Héctor here, your AFM expert at Nanosurf calling out for people to share their Friday afternoon experiments. Today I'll...
- Nanosurf
- November 6, 2023
Read the introduction to the comprehensive white paper on electrical AFM modes here on Nanosurf Insights. Download the...
- Héctor Corte-León
- November 3, 2023
Héctor here, your AFM expert at Nanosurf calling out for people to share their Friday afternoon experiments. Today I'll...
- Nanosurf
- November 1, 2023
How important are calibration samples? How frequently should we use them?
- Nanosurf
- October 11, 2023
Is there a reason why some materials cannot be measured by AFM?
- Nanosurf
- August 30, 2023
How can we determine which parameters to use for measuring elasticity?
- Nanosurf
- August 22, 2023
Nanosurf just released a new application note, "Enhancing Piezoresponse Force Microscopy with...
- Nanosurf
- July 26, 2023
Does the Material of the Cantilever Affect the Image Quality?